DocumentCode :
511724
Title :
An Heuristic Genetic Algorithm Solve Test Point Selecting with Unreliable Test
Author :
Pan, Jia-Liang ; Ye, Xiao-Hui ; Xue, Qiang
Author_Institution :
Dept. of Electron. Eng., Naval Univ. of Eng., Wuhan, China
Volume :
1
fYear :
2009
fDate :
28-30 Oct. 2009
Firstpage :
227
Lastpage :
232
Abstract :
A mathematical model of the test selection with unreliable test is created and a heuristic function of the test point are established based on the tolerances of the test point detection, coverage and reliance in this paper. In order to overcome the computational explosion, the genetic algorithm with heuristic function is proposed to settle the test selection problem with unreliable test. The algorithm is illustrated and tested using a range of a real-word system. The examples show that this algorithm is significantly better than simple genetic algorithm. It is also feasible and effective, especially in the large-scale system.
Keywords :
genetic algorithms; program testing; computational explosion; heuristic function; heuristic genetic algorithm solve test point selecting; large-scale system; mathematical model; real-word system; test point detection; test selection; unreliable test; Algorithm design and analysis; Costs; Electronic equipment testing; Explosions; Fault diagnosis; Finite impulse response filter; Genetic algorithms; Genetic engineering; Greedy algorithms; System testing; genetic algorithm; heuristic function; test point selecting; testability analysis; unreliable test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Engineering, 2009. WCSE '09. Second International Workshop on
Conference_Location :
Qingdao
Print_ISBN :
978-0-7695-3881-5
Type :
conf
DOI :
10.1109/WCSE.2009.659
Filename :
5403476
Link To Document :
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