Title :
High-speed signal termination analysis using a co-simulation approach
Author :
Chang, R.W.-Y. ; See, Kye-Yak ; Soh, Wei-Shan ; Oswal, Manish ; Wang, Lin-Biao
Author_Institution :
Guided Syst. Div., DSO Nat. Labs., Singapore, Singapore
Abstract :
Matched terminations of high-speed digital buses have long been the focus of high-speed board design. With increasing edge rates, proper bus termination has become even more crucial in today´s high-speed PCB interconnect design. Using a co-simulation approach, the 3D electromagnetic (EM) effects of high-speed interconnects and the circuit behavioral IBIS models of active devices are combined to investigate high-speed clock termination designs. Such an approach allows the high-frequency effects to be taken into account and therefore yields good accuracy for realistic high-speed board. A practical example is demonstrated based on the co-simulation approach.
Keywords :
high-speed integrated circuits; printed circuit design; system buses; 3D electromagnetic effects; circuit behavioral IBIS models; cosimulation approach; edge rates; high-speed PCB interconnect design; high-speed board design; high-speed clock termination designs; high-speed digital buses; high-speed signal termination analysis; Charge carriers; Circuits; Current measurement; Electron beams; Probes; Radiative recombination; Scanning electron microscopy; Semiconductor materials; Signal analysis; Spontaneous emission; EM transient co-simulation; high-speed clock; signal integrity; termination;
Conference_Titel :
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-9-8108-2468-6