DocumentCode :
511794
Title :
Testing of pixellated CZT and CdTe detectors at the 200µm level
Author :
Jung, G. ; Berry, A. ; Midgley, S. ; Panjkovic, G.
Author_Institution :
CRC for Biomed. Imaging Dev. Ltd., Bundoora, VIC, Australia
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
187
Lastpage :
190
Abstract :
Cadmium Zinc Telluride (CZT) and Cadmium Telluride (CdTe) detectors with 200 μm pixellated electrodes were tested with the aim to determine material properties and electrical parameters for hybrid pixel detector (HPD) systems. A 32 channel discrete analogue preamplifier platform was designed and manufactured in which radiation tests were performed on packaged detectors. Although simple in concept, numerous obstacles were encountered as a result of the bump bonding process. This paper provides an overview of HPD development at the Monash Centre for Synchrotron Science, details the tests performed on the current prototype detectors and illustrates the general methodologies used on the development pathway.
Keywords :
cadmium compounds; detector circuits; materials testing; preamplifiers; zinc compounds; CdTe; CdTe detectors; CdZnTe; Monash Centre for Synchrotron Science; bump bonding process; channel discrete analogue preamplifier platform; hybrid pixel detector systems; packaged detectors; pixellated CZT testing; radiation tests; size 200 mum; Cadmium compounds; Detectors; Electrodes; Manufacturing; Material properties; Materials testing; Performance evaluation; Preamplifiers; System testing; Zinc compounds; ASIC; CZT; CdTe; X-ray; pixel detector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-9-8108-2468-6
Type :
conf
Filename :
5403861
Link To Document :
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