DocumentCode
511861
Title
Transient electrical thermal analysis of ESD process using 3-D finite element method
Author
Hou, Yuejin ; Tan, Cher Ming
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2009
fDate
14-16 Dec. 2009
Firstpage
129
Lastpage
132
Abstract
In this work, the transient electrical-thermal response of a simple ESD protection circuit to excessive current during an electrostatic discharge (ESD) event is investigated numerically, using 3-D finite element analysis (FEA). The 3-D transient temperature distribution in the circuit can be revealed and the fusing phenomenon of interconnection is captured during the ESD process using human body model (HBM). The method in this work provides a quantitative approach to study the ESD damaging process in the future.
Keywords
electrostatic discharge; finite element analysis; integrated circuit interconnections; integrated circuit reliability; transient analysis; 3D finite element analysis; 3D transient temperature distribution; ESD protection circuit; FEA; electrostatic discharge; human body model; interconnection; reliability issues; transient electrical thermal analysis; Biological system modeling; Diodes; Electrostatic discharge; Finite element methods; Humans; Integrated circuit interconnections; Inverters; Protection; Transient analysis; Voltage; electrostatic discharge; finite element method;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Conference_Location
Singapore
Print_ISBN
978-9-8108-2468-6
Type
conf
Filename
5403933
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