• DocumentCode
    511861
  • Title

    Transient electrical thermal analysis of ESD process using 3-D finite element method

  • Author

    Hou, Yuejin ; Tan, Cher Ming

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    129
  • Lastpage
    132
  • Abstract
    In this work, the transient electrical-thermal response of a simple ESD protection circuit to excessive current during an electrostatic discharge (ESD) event is investigated numerically, using 3-D finite element analysis (FEA). The 3-D transient temperature distribution in the circuit can be revealed and the fusing phenomenon of interconnection is captured during the ESD process using human body model (HBM). The method in this work provides a quantitative approach to study the ESD damaging process in the future.
  • Keywords
    electrostatic discharge; finite element analysis; integrated circuit interconnections; integrated circuit reliability; transient analysis; 3D finite element analysis; 3D transient temperature distribution; ESD protection circuit; FEA; electrostatic discharge; human body model; interconnection; reliability issues; transient electrical thermal analysis; Biological system modeling; Diodes; Electrostatic discharge; Finite element methods; Humans; Integrated circuit interconnections; Inverters; Protection; Transient analysis; Voltage; electrostatic discharge; finite element method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-9-8108-2468-6
  • Type

    conf

  • Filename
    5403933