DocumentCode :
511861
Title :
Transient electrical thermal analysis of ESD process using 3-D finite element method
Author :
Hou, Yuejin ; Tan, Cher Ming
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
129
Lastpage :
132
Abstract :
In this work, the transient electrical-thermal response of a simple ESD protection circuit to excessive current during an electrostatic discharge (ESD) event is investigated numerically, using 3-D finite element analysis (FEA). The 3-D transient temperature distribution in the circuit can be revealed and the fusing phenomenon of interconnection is captured during the ESD process using human body model (HBM). The method in this work provides a quantitative approach to study the ESD damaging process in the future.
Keywords :
electrostatic discharge; finite element analysis; integrated circuit interconnections; integrated circuit reliability; transient analysis; 3D finite element analysis; 3D transient temperature distribution; ESD protection circuit; FEA; electrostatic discharge; human body model; interconnection; reliability issues; transient electrical thermal analysis; Biological system modeling; Diodes; Electrostatic discharge; Finite element methods; Humans; Integrated circuit interconnections; Inverters; Protection; Transient analysis; Voltage; electrostatic discharge; finite element method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-9-8108-2468-6
Type :
conf
Filename :
5403933
Link To Document :
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