• DocumentCode
    511987
  • Title

    Research on dielectric properties of gallium arsenides by using THz-TDS

  • Author

    Li, Jiusheng ; Zhao, Xiaoli ; Li, Jianrui

  • Author_Institution
    Centre for THz Research, China Jiliang University, Hangzhou 310018, China
  • Volume
    2009-Supplement
  • fYear
    2009
  • fDate
    2-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    By using terahertz time domain spectroscopy (THz-TDS) system, the terahertz dielectric properties of various gallium arsenides were tested in the frequency range extending from 0.2 to 1.5 THz. The power absorption coefficient and refractive index of various resistivity gallium arsenides were measured and compared. The refractive index of the high resistivity and ultra-high resistivity GaAs are equal to be 6.53 and 5.9, respectively. The variation of the refractive index of the GaAs was less than 1%, ranging from 0.2 to 1.5THz, but the absorption coefficient of the ultra-high resistivity GaAs showed very different frequency-dependent behaviors, ranging from 0.02cm−1 to 2.21cm−1, within the investigated frequency range. The results show that the ultra-high resistivity GaAs will be a good candidate material for terahertz transmission waveguide.
  • Keywords
    Conductivity; Dielectric measurements; Electrochemical impedance spectroscopy; Electromagnetic wave absorption; Extraterrestrial measurements; Frequency; Gallium arsenide; Laser beams; Refractive index; Ultrafast optics; Spectroscopy; THz; absorption coefficient; gallium arsenides; refractive index; spectral characteristics; time-domain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    978-1-55752-877-3
  • Electronic_ISBN
    978-1-55752-877-3
  • Type

    conf

  • Filename
    5405250