Title :
Modeling the effect of surface roughness on the back-scattering coefficient and emissivity of a soil-litter medium using a numerical model
Author :
Lawrence, H. ; Demontoux, F. ; Wigneron, J.-P. ; Kerr, Y. ; Wu, T.-D. ; Borderies, P. ; Paillou, P. ; Chen, L. ; Shi, J.-C.
Author_Institution :
MCM Dept., Univ. of Bordeaux 1, Bordeaux, France
Abstract :
In the context of the SMOS mission, a new numerical method based on the finite element method is presented which can be used to model the radiometric L-band emission of soil and litter layers in forests. Many different characteristics of these layers that affect the soil-litter emission can be incorporated into the model, including surface roughness, inclusions and volume effects. Soil moisture is incorporated into the model as a function of the dielectric permittivity constant. The model is validated for a single dielectric layer with a surface roughness of Gaussian autocorrelation function by comparing results of the backscattering coefficient with those calculated by the 2D method of moments. Good general agreement is obtained between these results. An emissivity calculation for a single layer rough surface is also presented and compared with the emissivity of a flat layer.
Keywords :
backscatter; finite element analysis; hydrological techniques; radiometry; soil; surface roughness; 3D numerical model; Gaussian autocorrelation function; SMOS mission; backscattering coefficient; dielectric permittivity constant; emissivity calculation; finite element method; forests; microwave radiometry; radiometric L-band emission; single layer rough surface; soil moisture; soil-litter medium; surface roughness; Context modeling; Dielectric constant; Finite element methods; L-band; Numerical models; Radiometry; Rough surfaces; SMOS mission; Soil moisture; Surface roughness; 3D numerical model; SMOS mission; microwave radiometry; rough surfaces;
Conference_Titel :
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location :
Cape Town
Print_ISBN :
978-1-4244-3394-0
Electronic_ISBN :
978-1-4244-3395-7
DOI :
10.1109/IGARSS.2009.5417805