Title :
Processing system and algorithms for the TanDEM-X mission
Author :
Breit, H. ; Fritz, T. ; Eineder, M. ; Bamler, R. ; Lachaise, M. ; Brcic, R. ; Adam, N. ; Yague-Martinez, N.
Author_Institution :
Remote Sensing Technol. Inst., German Aerosp. Center (DLR), Wessling, Germany
Abstract :
In 2009, the German radar satellite TerraSAR-X will be supplemented with the TanDEM-X satellite to form the first bi-static single pass interferometer in space. TanDEM-X will fly close to TerraSAR-X in a controlled helix configuration for 3 years to jointly acquire interferometric SAR data in bistatic mode. The primary TanDEM-X mission goal is to generate a global Digital Elevation Model (DEM) with a relative point-to-point height accuracy of 2 meters for moderate terrain at 12 m posting. This paper outlines the SAR data workflow from quality check screening through to bistatic focusing and interferometric processing to raw DEM generation.
Keywords :
digital elevation models; focusing; geophysical signal processing; radar interferometry; remote sensing by radar; spaceborne radar; synthetic aperture radar; German radar satellite; SAR data workflow; TanDEM-X satellite; TerraSAR-X; bistatic focusing; bistatic single pass interferometer; global digital elevation model; interferometric SAR; interferometric processing; quality check screening; relative point-to-point height accuracy; Calibration; Data acquisition; Decorrelation; Digital elevation models; Instruments; Remote sensing; Satellite broadcasting; Space technology; Spaceborne radar; Testing; Bistatic SAR; Digital Elevation Model (DEM); SAR Interferometry; TanDEM-X;
Conference_Titel :
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location :
Cape Town
Print_ISBN :
978-1-4244-3394-0
Electronic_ISBN :
978-1-4244-3395-7
DOI :
10.1109/IGARSS.2009.5418203
