DocumentCode :
513590
Title :
Analysis of repeatability in conducted emission measurements
Author :
Kumar, L. Sathesh ; Yegneswari, R. ; Subbarao, B. ; Sivaramakrishnan, R.
Author_Institution :
Centre for Electromagn., SAMEER, Chennai, India
fYear :
2006
fDate :
23-24 Feb. 2006
Firstpage :
337
Lastpage :
341
Abstract :
International Civilian EMI/EMC standards define set-up to unify criteria. But it is difficult for one standard to cover every possibility that is applicable to different types of equipments. Inconsistencies are most often encountered and the repeatability problems are investigated, and reported for conducted emission measurement. SAMEER, as a EMC test laboratory has taken up such analysis to study the repeatability problems in conducted emission measurement. Laptop computer, a widely used SMPS based noisy source, was chosen as an Equipment Under Test (EUT). Various configurations of EUT were investigated and presented the results in this paper. Including these details in the test report can minimize the repeatability problems.
Keywords :
IEC standards; electric field measurement; electromagnetic compatibility; electromagnetic interference; SAMEER; conducted emission measurements; equipment under test; international civilian EMI-EMC standards; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Impedance; Information technology; Laboratories; Measurement standards; Portable computers; Switched-mode power supply; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ElectroMagnetic Interference and Compatibility (INCEMIC), 2006 Proceedings of the 9th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-5203-3
Type :
conf
Filename :
5419727
Link To Document :
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