DocumentCode :
513672
Title :
Low-Power, Ultra-Low Capacitance Bipolar Transistor Compatible with Mainstream CMOS
Author :
van der Wel, Wim ; Koster, Ronald ; Jansen, Sander ; Hurkx, Fred ; Bladt, Ed
Author_Institution :
Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands
fYear :
1995
fDate :
25-27 Sept. 1995
Firstpage :
425
Lastpage :
428
Abstract :
A 10-mask 0.5-¿m process is presented which combines three viable technology modules to achieve very small capacitances in a bipolar NPN transistor, whereas compatibility with mainstream CMOS is maintained. Shallow and deep trenches reduce the collector/base and collector/substrate capacitances by more than 50 %. Straps minimise dimensions of the active region by more than 50 %. Application of the Poly-Ridge Emitter Transistor (PRET) concept strongly reduces both base and emitter areas by 33 and 60 %, respectively. Capacitances are lower than conventional 0.5 ¿m-devices by a factor ranging between 2 and 5, whereas high-frequency capability and CMOS compatibility are maintained.
Keywords :
Bipolar transistors; CMOS process; CMOS technology; Carbon capture and storage; Energy consumption; Etching; Laboratories; Parasitic capacitance; Planarization; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
Print_ISBN :
286332182X
Type :
conf
Filename :
5435922
Link To Document :
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