DocumentCode :
513676
Title :
A Capacitive Chemical Sensor based on Porous Silicon
Author :
Schöning, M.J. ; Crott, M. ; Ronkel, F. ; Thust, M. ; Schultze, J.W. ; Kordos, P. ; Lüth, H.
Author_Institution :
Institut fÿr Schicht-und Ionentechnik, Forschungszentrum Jÿlich GmbH, D-52425 Jÿlich, Germany
fYear :
1996
fDate :
9-11 Sept. 1996
Firstpage :
907
Lastpage :
910
Abstract :
A new capacitive field effect sensor based on a porous EIS (Electrolyte Insulator Semiconductor) structure is presented The porous silicon sensor was prepared using standard techniques of semiconductor processing Experimental conditions were adjusted to realize a well-defined macroporous formation of the silicon substrate. The porous sensor device made of Si/SiO2/Si3N4 exhibits a high, near-Nernstian pH sensitivity of about 54 mV per pH in the concentration range from pH 4 to pH 8, similar to a planar EIS structure with the same layer sequence. The enlargement of the active sensor area due to the porous layer structure increases the measured capacitance and thus allows a scaling down of the sensor.
Keywords :
Area measurement; Capacitance measurement; Capacitive sensors; Chemical sensors; Electrodes; Insulation; Scanning electron microscopy; Silicon; Substrates; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
Print_ISBN :
286332196X
Type :
conf
Filename :
5435926
Link To Document :
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