DocumentCode :
513738
Title :
Analysis and Characterization of Polycrystalline Silicon Thin-Film Transistors
Author :
Colalongo, L. ; Valdinoci, M. ; Baccarani, G. ; Pecora, A. ; Policicchio, I. ; Fortunato, G. ; Plais, F. ; Legagneux, P. ; Reita, C. ; Pribat, D.
Author_Institution :
Universit? di Bologna, viale Risorgimento, 2 - 40136 Bologna, Italy
fYear :
1995
fDate :
25-27 Sept. 1995
Firstpage :
75
Lastpage :
78
Abstract :
Polycrystalline silicon thin-film transistors (Poly-TFTs) are getting more and more attractive for future, active-matrix, flat-panel displays (AMFPDs) and, more generally, for large-area electronic products. This is due to the relatively-large carrier mobility in polycrystalline silicon, which typically exceeds the amorphous-silicon mobility by two orders of magnitude and makes this material suitable for applications requiring a fair degree of speed or, for a given speed, the ability to drive large capacitive loads. In order to successfully design analog and digital circuitry based on TFTs, however, a clear understanding of their static and dynamic behaviour is required. In this paper, we address the issue of quantitatively modelling TFTs under static and dynamic conditions; we thus simulate their transfer and output characteristics at different temperatures using our device analysis tool (HFIELDS) which has been suitably enhanced to account for the most important physical effects occurring in TFTs. So doing, we determine a set of consistent parameter values by which very good agreement with experimental data at various temperatures is observed. Next, we simulate the switching behaviour of a saturated-load Poly-TFT inverter, and assess the suitability of TFT-based logic circuits to carry out the matrix-addressing function.
Keywords :
Active matrix technology; Analytical models; Circuit simulation; Displays; Inverters; Logic circuits; Silicon; Switching circuits; Temperature; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
Print_ISBN :
286332182X
Type :
conf
Filename :
5436009
Link To Document :
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