Title :
Prediction of compact MOS model parameters for low-power application
Author :
Velghe, R.M.D.A. ; Klaassen, D.B.M.
Author_Institution :
Philips Research Laboratories Eindhoven, The Netherlands
Keywords :
Calibration; Circuit simulation; Feedback circuits; Geometry; Laboratories; Niobium; Predictive models; Silicon; Solid modeling; Threshold voltage;
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
