Title :
High Frequency InGaP/GaAs Planar Heterojunction Bipolar Transistors
Author :
Driad, R. ; Duchenois, A.M. ; Alexandre, F. ; Menouni, M. ; Desrousseaux, P. ; Legay, P. ; Launay, P.
Author_Institution :
FRANCE TELECOM, Centre National d´´Etudes des T?l?communications, Paris B, Laboratoire de Bagneux, 196 avenue Henri Rav?ra, BP 107, 92225 Bagneux (France).
Abstract :
The present paper reports on high frequency In0.49Ga0.51P/GaAs HBTs and high speed lightwave communication circuits using a novel planar self-aligned fabrication process based on chemical beam epitaxial (CBE) selective regrowtlh of both the extrinsic base and subcollector layers. Using this process, a current gain of 43 and cutoff frequencies of 50 and 70 GHz for fT and fMAX respectively, have been achieved for a 10Ã3 ¿m2 emitter-base junction area device. A 7 Gbit/s decision circuit (DEC) and a 17 GHz dynamic frequency divider were successfully fabricated using planar HBTs.
Keywords :
Chemical processes; Contact resistance; Cutoff frequency; Frequency conversion; Gallium arsenide; Heterojunction bipolar transistors; Microwave circuits; Microwave devices; Microwave theory and techniques; Molecular beam epitaxial growth;
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands