DocumentCode :
513804
Title :
All-Injection Modeling of Collector Current and Transit Time in SiGe Bipolar Transistors
Author :
Rinaldi, N.F.
Author_Institution :
Department of Electronic Engineering of the University of Naples, via Claudio, 21 - 80125 - Naples, Italy
fYear :
1995
fDate :
25-27 Sept. 1995
Firstpage :
785
Lastpage :
788
Abstract :
An analytical investigation of the minority-carrier transport properties at arbitrary injection levels is presented. Firstly, it is shown that the minority-carrier transport equation is exactly soluble at high-injection levels, yielding closed-form expressions for the injected current, transit time and sheet resistance. Then, a simple analytical model valid at arbitrary injection levels is proposed. The analysis retains a general dependence of the transport parameters on composition and doping concentration, and is thus applicable to SiGe HBTs.
Keywords :
Analytical models; Bipolar transistors; Closed-form solution; Current density; Doping profiles; Electrons; Equations; Germanium silicon alloys; Semiconductor process modeling; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
Print_ISBN :
286332182X
Type :
conf
Filename :
5436131
Link To Document :
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