• DocumentCode
    513866
  • Title

    Leakage Current in Polysilicon TFTs: Experiments and Interpretation

  • Author

    Colalongo, L. ; Valdinoci, M. ; Baccarani, G. ; Migliorato, Piero ; Tallarida, G. ; Reita, C.

  • Author_Institution
    DEIS, UniversitÃ\xa0 di Bologna, Italy; DIM, UniversitÃ\xa0 di Trento, Italy
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    415
  • Lastpage
    418
  • Abstract
    Polycrystalline silicon thin-film transistors (poly-TFTs) are getting more and more attractive for Active-Matrix Liquid Crystal Displays (AMLCDs) and, more generally, for large-area electronic products. Anomalously high off-currents, however, are an important limiting factor preventing a wide use of poly-TFTs. The purpose of this work is that of investigating the anomalously large leakage-currents in (poly-TFTs) by numerical simulation, taking into account the effect of energy-distributed traps and field-enhanced generation mechanisms.
  • Keywords
    Active matrix liquid crystal displays; Active matrix technology; Electron emission; Electron traps; Leakage current; Silicon; Temperature dependence; Thin film transistors; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5436224