Title :
Sensitivity and Noise of MOS Magnetic Field Effect Transistors
Author :
Killat, D. ; Umbach, F. ; Kluge, J.v. ; Schmitz, R. ; Langheinrich, W.
Author_Institution :
Solid State Electronics Laboratories, Technical University of Darmstadt, Schlossgartenstrasse 8, D-64289 Darmstadt, Germany
Abstract :
The characteristics of magnetic field-sensitive split-drain MOSFETs (MAGFETs) are experimentally measured. The sensitivity depends on the geometry and the operating point of the MAGFET. Particular attention was taken on the lateral parasitic conductance between the split drains. The equivalent spectral noise density of the magnetic flux density was measured and discussed.
Keywords :
Circuit noise; Electrical resistance measurement; FETs; MOSFETs; Magnetic field measurement; Magnetic noise; Magnetic sensors; Noise measurement; Semiconductor device noise; Sensor phenomena and characterization;
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy