Title :
A high performance VLSI structure-SOI/SDB complementary buried channel MOS (CBCMOS) IC
Author :
Qin-Yi, Tong ; Xiao-Li, Xu ; Hui-Zhen, Zhang
Author_Institution :
Microelectronics Center, Southeast University, Nanjing 210018, China
Abstract :
A Complementary Buried Channel MOS(CBCMOS) integrated circuit has been fabricated on a SOI(Silicon On Insulator) substrate prepared by SDB(Silicon wafer Direct Bonding) technology. CBCMOS is a ``fully depteted buried channel´´ MOSFET which is different from conventional ``surface buried channel´´ MOS device in which a pn junction exists at channel surface, Moreover, pn junction is totally eliminated in CBCMOS device structure. Simulation and experimental results have demonstrated that small geometry effects, breakdown vottage, speed etc. have been significantly improved. Kink effect has been totally eliminated. Futhermore, the fabrication process is fully compatible with conventional CMOS/SOI technology.
Keywords :
CMOS technology; Electric breakdown; Geometry; Insulation; Integrated circuit technology; MOS devices; MOSFET circuits; Solid modeling; Very large scale integration; Wafer bonding;
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England