• DocumentCode
    513916
  • Title

    A high performance VLSI structure-SOI/SDB complementary buried channel MOS (CBCMOS) IC

  • Author

    Qin-Yi, Tong ; Xiao-Li, Xu ; Hui-Zhen, Zhang

  • Author_Institution
    Microelectronics Center, Southeast University, Nanjing 210018, China
  • fYear
    1990
  • fDate
    10-13 Sept. 1990
  • Firstpage
    519
  • Lastpage
    522
  • Abstract
    A Complementary Buried Channel MOS(CBCMOS) integrated circuit has been fabricated on a SOI(Silicon On Insulator) substrate prepared by SDB(Silicon wafer Direct Bonding) technology. CBCMOS is a ``fully depteted buried channel´´ MOSFET which is different from conventional ``surface buried channel´´ MOS device in which a pn junction exists at channel surface, Moreover, pn junction is totally eliminated in CBCMOS device structure. Simulation and experimental results have demonstrated that small geometry effects, breakdown vottage, speed etc. have been significantly improved. Kink effect has been totally eliminated. Futhermore, the fabrication process is fully compatible with conventional CMOS/SOI technology.
  • Keywords
    CMOS technology; Electric breakdown; Geometry; Insulation; Integrated circuit technology; MOS devices; MOSFET circuits; Solid modeling; Very large scale integration; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
  • Conference_Location
    Nottingham, England
  • Print_ISBN
    0750300655
  • Type

    conf

  • Filename
    5436305