DocumentCode :
513928
Title :
Improvement of output impedance in SOI MOSFETs
Author :
Gao, M-H. ; Colinge, J -P ; Wu, S -H ; Claeys, C.
Author_Institution :
IMEC, Kapeldreef 75, B-3030 Leuven, Belgium
fYear :
1990
fDate :
10-13 Sept. 1990
Firstpage :
445
Lastpage :
448
Abstract :
A common gate dual MOSFET structure is proposed to improve the output impedance of SOI MOS transistors. The device consists of two transistors in series with a common gate but operates as a single device. Kink effect can be confined to the upper transistor while the overall output characteristics of the dual device are dominated by the lower transistor. As a consequence, the kink effect can be effectvely suppressed in the overall output characterstics. Furthermore, the output breakdown characteristics and the saturaton drain output imapednce are also much improved.
Keywords :
Analog circuits; Bipolar transistor circuits; Breakdown voltage; Current measurement; Impedance measurement; Length measurement; MOSFETs; Q measurement; Semiconductor thin films; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1990. ESSDERC '90. 20th European
Conference_Location :
Nottingham, England
Print_ISBN :
0750300655
Type :
conf
Filename :
5436320
Link To Document :
بازگشت