• DocumentCode
    513941
  • Title

    Si Permeable Based Transistor Realization Using a MOS Compatible Technology

  • Author

    Letourineau, P. ; Vincent, G. ; Perret, P. ; Badoz, P.A. ; Rosencher, E.

  • Author_Institution
    CNET-CNS, BP 98, 38243 Mcylan Cedcx, FRANCE
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    579
  • Lastpage
    582
  • Abstract
    We have fabricated silicon permeable base transistors (PBT) using a MOS technology process. The critical lithography defining the metal base grating is a standard optical lithography, which allows submicronic periodicity of the base grating, and therefore permits the realisation of PBT with either normnally on or normally off transistor characteristics. Thanks to the high current density achievable in these devices and the high degree of compatibitlity with MOS technologies, PBT clearly appears as a possible alternative for bipolar metal oxide semiconductor (BICMOS) applications.
  • Keywords
    Etching; Gratings; Large Hadron Collider; Lithography; MOSFETs; Optical films; Schottky gate field effect transistors; Semiconductor films; Silicon; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436536