DocumentCode
513941
Title
Si Permeable Based Transistor Realization Using a MOS Compatible Technology
Author
Letourineau, P. ; Vincent, G. ; Perret, P. ; Badoz, P.A. ; Rosencher, E.
Author_Institution
CNET-CNS, BP 98, 38243 Mcylan Cedcx, FRANCE
fYear
1989
fDate
11-14 Sept. 1989
Firstpage
579
Lastpage
582
Abstract
We have fabricated silicon permeable base transistors (PBT) using a MOS technology process. The critical lithography defining the metal base grating is a standard optical lithography, which allows submicronic periodicity of the base grating, and therefore permits the realisation of PBT with either normnally on or normally off transistor characteristics. Thanks to the high current density achievable in these devices and the high degree of compatibitlity with MOS technologies, PBT clearly appears as a possible alternative for bipolar metal oxide semiconductor (BICMOS) applications.
Keywords
Etching; Gratings; Large Hadron Collider; Lithography; MOSFETs; Optical films; Schottky gate field effect transistors; Semiconductor films; Silicon; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location
Berlin, Germany
Print_ISBN
0387510001
Type
conf
Filename
5436536
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