DocumentCode :
513941
Title :
Si Permeable Based Transistor Realization Using a MOS Compatible Technology
Author :
Letourineau, P. ; Vincent, G. ; Perret, P. ; Badoz, P.A. ; Rosencher, E.
Author_Institution :
CNET-CNS, BP 98, 38243 Mcylan Cedcx, FRANCE
fYear :
1989
fDate :
11-14 Sept. 1989
Firstpage :
579
Lastpage :
582
Abstract :
We have fabricated silicon permeable base transistors (PBT) using a MOS technology process. The critical lithography defining the metal base grating is a standard optical lithography, which allows submicronic periodicity of the base grating, and therefore permits the realisation of PBT with either normnally on or normally off transistor characteristics. Thanks to the high current density achievable in these devices and the high degree of compatibitlity with MOS technologies, PBT clearly appears as a possible alternative for bipolar metal oxide semiconductor (BICMOS) applications.
Keywords :
Etching; Gratings; Large Hadron Collider; Lithography; MOSFETs; Optical films; Schottky gate field effect transistors; Semiconductor films; Silicon; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
Print_ISBN :
0387510001
Type :
conf
Filename :
5436536
Link To Document :
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