Title :
Investigation of GaAs/AIGaAs Quantum Well Lasers by Micro Raman Spectroscopy
Author :
Beeck, S. ; Egeler, T. ; Abstreiter, G. ; Brugger, H. ; Epperlein, P.W. ; Webb, D.J. ; Hanke, C. ; Hoyler, C. ; Korte, L.
Author_Institution :
Walter Schottky Institut, TUM, D-8046 Garching, FRG
Abstract :
GaAs/AlGaAs quantum well lasers are investigated with non destructive micro Raman spectroscopy. Electronic properties and temperature behaviour at the mirror surfaces were studied by probe lasers with high spatial resolution. Electric field induced Raman scattering (EFIRS) is suitable for observing the band bending, caused by surface states. Temperature behaviour of coated and uncoated mirrors and the spatial temperature profile are investigated by measuring the Stokes- and anti-Stokes intensities of the GaAs TO-phonon. Resonant electronic Raman scattering leads to spatial distribution of carrier densities.
Keywords :
Gallium arsenide; Mirrors; Probes; Quantum well lasers; Raman scattering; Resonance; Spatial resolution; Spectroscopy; Surface emitting lasers; Temperature;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
