• DocumentCode
    513989
  • Title

    Self-consistent Modelling of npn and pnp Transistors

  • Author

    Kellelher, Ann ; Doyle, Denis J F ; Lyden, Colin ; Lane, William A. ; Edwards, Susan P.

  • Author_Institution
    National Microelectronics Research Centre, University College, Cork, Ireland.
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    314
  • Lastpage
    317
  • Abstract
    This paper examines recently published physical models for carrier transport, which distinguish between minority and majority carrier mobilties. The models have been implemented in a bipolar device simulator and comparisons have been made between predicted and measured results for both npn and pnp tansistors. Discrepancies between measured and simulated device currents are discussed and further experiments to isolate sources of disagreement are outlined.
  • Keywords
    Bipolar transistors; Charge carrier processes; Current measurement; Doping profiles; Electron emission; Gain measurement; Length measurement; Photonic band gap; Predictive models; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436602