Title :
Self-consistent Modelling of npn and pnp Transistors
Author :
Kellelher, Ann ; Doyle, Denis J F ; Lyden, Colin ; Lane, William A. ; Edwards, Susan P.
Author_Institution :
National Microelectronics Research Centre, University College, Cork, Ireland.
Abstract :
This paper examines recently published physical models for carrier transport, which distinguish between minority and majority carrier mobilties. The models have been implemented in a bipolar device simulator and comparisons have been made between predicted and measured results for both npn and pnp tansistors. Discrepancies between measured and simulated device currents are discussed and further experiments to isolate sources of disagreement are outlined.
Keywords :
Bipolar transistors; Charge carrier processes; Current measurement; Doping profiles; Electron emission; Gain measurement; Length measurement; Photonic band gap; Predictive models; Semiconductor process modeling;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany