DocumentCode
513999
Title
Automated Measurement of the Bias Dependence of Low Frequency Small-signal Parameter Dispersions in GaAs MESFETs
Author
Defreitas, M.T. ; Swanson, J.G.
Author_Institution
Department of Electronic & Electrical Engineering, King´´s College London, Strand, LONDON WC2R 2LS, U.K.
fYear
1989
fDate
11-14 Sept. 1989
Firstpage
263
Lastpage
266
Abstract
An automated system has been developed which measures the small-signal gm and go of FET´s over a wide bias and frequency range. This behaviour has been investigated in GaAs MESFET´s and several distinct mechanisms have been observed. Backgating has also been measured and related to the gm dispersions of the same device.
Keywords
Dispersion; Electric variables measurement; Frequency dependence; Frequency measurement; Gallium arsenide; Impedance; MESFETs; Operational amplifiers; Resonance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location
Berlin, Germany
Print_ISBN
0387510001
Type
conf
Filename
5436616
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