DocumentCode
514034
Title
Numerical Analysis of Breakdown in Silicon Diodes
Author
Quade, W. ; Rudan, M.
Author_Institution
Dipartimento di Elettronica, Informatica e Sistemistica, Universitá di Bologna, viale Risorgimento 2, 40136 Bologna, Italy; Dipartimento di Fisica, Universitá di Modena, via G. Campi 213/A, 41100 Modena, Italy
fYear
1989
fDate
11-14 Sept. 1989
Firstpage
97
Lastpage
100
Keywords
Charge carrier processes; Current density; Diodes; Electric breakdown; Integral equations; Large Hadron Collider; Nominations and elections; Numerical analysis; Silicon; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location
Berlin, Germany
Print_ISBN
0387510001
Type
conf
Filename
5436659
Link To Document