• DocumentCode
    514034
  • Title

    Numerical Analysis of Breakdown in Silicon Diodes

  • Author

    Quade, W. ; Rudan, M.

  • Author_Institution
    Dipartimento di Elettronica, Informatica e Sistemistica, Universitá di Bologna, viale Risorgimento 2, 40136 Bologna, Italy; Dipartimento di Fisica, Universitá di Modena, via G. Campi 213/A, 41100 Modena, Italy
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    97
  • Lastpage
    100
  • Keywords
    Charge carrier processes; Current density; Diodes; Electric breakdown; Integral equations; Large Hadron Collider; Nominations and elections; Numerical analysis; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436659