DocumentCode :
514041
Title :
On the High-frequency Behaviour of Ohmic Contacts
Author :
Zirath, H.
Author_Institution :
Department of Applied Electronphysics, Chalmers University of Technology, Göteborg, Sweden
fYear :
1989
fDate :
11-14 Sept. 1989
Firstpage :
63
Lastpage :
66
Keywords :
Capacitance; Contact resistance; Current measurement; Frequency measurement; Gallium arsenide; Impedance measurement; Impurities; Ohmic contacts; Q measurement; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
Print_ISBN :
0387510001
Type :
conf
Filename :
5436666
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=514041
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