DocumentCode :
514059
Title :
Gettering of Metal Precipitates
Author :
Bronner, Gary ; Plummer, James
Author_Institution :
IBM TJ Watson Research Center, PO Box 218, Yorktown Heights, NY 10598
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
557
Lastpage :
560
Abstract :
In this paper we deal with the effect of silicon interstitials on metal precipitates. We show that excess silicon interstitials which are injected by common gettering treatments cause most metal precipitates to shrink but a few to grow. Data from the literature confirms that the precipitates which grow by the absorption of silicon interstitials (primarily FeSi2 and NiSi2) are found exclusively in regions that act as net injectors of silicon interstitials. Other precipitates shrink in the presence of excess silicon interstitials and are easily gettered. This explains why silicon interstitial injection is essential for effective gettering.
Keywords :
Absorption; Argon; Copper; Electric breakdown; Gettering; Gold; Iron; Nickel; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436693
Link To Document :
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