Title :
High Resolution Intrinsic MOS Capacitance-Measurement System
Author_Institution :
BULL S.A. - B2/028, Rue Jean Jaurÿs, 78340 Les Clayes-Sous-Bois - France
Keywords :
Aging; Capacitance measurement; Capacitance-voltage characteristics; Capacitors; Circuits; Geometry; Hot carriers; MOSFETs; SPICE; Solid modeling;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
