DocumentCode :
514090
Title :
BI(C)MOS Dream or Nightmare?
Author :
Hart, P.A.H.
Author_Institution :
Philips Research Laboratories, P.O. BOX 80.000, 5600 JA Eindhoven, The Netherlands
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
1
Lastpage :
8
Abstract :
The paper presents a summary of advantages of mixed bipolar-CMOS processes for analog and digital VLSI and some design considerations.
Keywords :
Avalanche breakdown; Bismuth; Breakdown voltage; CMOS logic circuits; Capacitors; Integrated circuit technology; Low voltage; Switches; Very large scale integration; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436738
Link To Document :
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