Title :
Influence of Acetylating Bi-amine Chain Extenders on the Properties of Polyurea
Author :
Song Wei ; Den Yu ; Hao Jingmei
Author_Institution :
Sch. of Autom., Tianjin Univ. of Technol., Tianjin, China
Abstract :
In this paper, hexamethylene-diamine(HAD) and m-phenylene diamine (m-PDA) were acetified to decrease the reaction activity of synthesizing polyureas and improve their properties. Novel sterically hindered chain extenders, diacetyl hexamethylene-diamine(MHAD) and diacetyl m-phenylenediamine (Mm-PDA) were synthesized with HAD, m-PDA and glacial acetic acid in the presence of phosphoric acid. Their chemical structures were confirmed through FTIR, Kjeldahl Nitrogen Determination method, High resolution ESI-FTICR mass spectrometry and 1H-NMR analysis. The results of measuring their melting stages showed that the purity of products was better. Polyureas were synthesized by two-step solution process of 4,4´-diphenyl diisocyanate(MDI) and amine terminated polyether(Jeffamine D-2000) with different chain extenders. The influence of modified diamine chain extenders on the gel time of the polyurea was investigated. The gel time was prolonged, that is, the reaction activity was decreased when MHAD and Mm-PDA were used as chain extenders instead of HAD and m-PDA. Thermal stability of polyureas was not affected, and their mechanical properties were heightened remarkably.
Keywords :
Fourier transform spectra; additives; chemical engineering; chemical reactions; infrared spectra; mass spectra; polymers; thermal stability; ESI-FTICR mass spectrometry; HNMR analysis; Kjeldahl nitrogen determination method; acetylating biamine chain extenders; chemical structures; glacial acetic acid; hexamethylene diamine; m-phenylene diamine; melting stages; polyurea; thermal stability; Automation; Chemical analysis; Chemical engineering; Chemical technology; Coatings; Mass spectroscopy; Mechanical factors; Mechatronics; Nitrogen; Production facilities; extending reaction; mechanical property; polyurea; reaction activity;
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
DOI :
10.1109/ICMTMA.2010.97