DocumentCode :
514735
Title :
BCRLS Identification Method for Hammerstein-Wiener Model
Author :
Li, Yan ; Mao, Zhi-zhong ; Wang, Yan
Author_Institution :
Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
Volume :
1
fYear :
2010
fDate :
13-14 March 2010
Firstpage :
745
Lastpage :
748
Abstract :
In this paper, an improved two-stage on-line identification algorithm is presented to identify Hammerstein-Wiener systems with process disturbance. The proposed algorithm consists of two steps: Firstly, the bias compensation recursive least squares method is adopted to identify the parameter products of original system. By introducing a correction term in the estimate of recursive least squares, the estimation bias caused by process noise is compensated. Secondly, the average method is employed to separate original system parameters. The simulation shows that the proposed algorithm is effective.
Keywords :
least squares approximations; stochastic processes; BCRLS identification method; Hammerstein-Wiener model; bias compensation recursive least squares method; online identification algorithm; Area measurement; Capacitance; Current measurement; Fault currents; Frequency diversity; Genetic mutations; Grounding; Transient analysis; Wavelet analysis; Wavelet packets; Hammerstein-Wiener systems; average method (AVE); bias compensation recursive least squares (BCRLS); parameter identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
Type :
conf
DOI :
10.1109/ICMTMA.2010.474
Filename :
5458870
Link To Document :
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