Research of Noise Suppression for CMOS Image Sensor

Author

Luo, Bin ; Yan, Lei ; Yang, Fuxing

Author_Institution

Beijing Univ. of Posts & Telecommun., Beijing, China

Volume

2

fYear

2010

fDate

13-14 March 2010

Firstpage

1100

Lastpage

1103

Abstract

Noise problem has a strong impact on the performance of sensor, especially in the field of aviation remote sensing. In this paper, the structure difference of CMOS and CCD image sensor is analyzed, and the noise affection and reasons are researched for CMOS image quality. Then the effective methods for each type of noise suppression are presented to improve the imaging capability. These researches provide theoretical support for the development of CMOS image sensor technology, and give a chance to use in the field of aviation remote sensing.

Keywords

CCD image sensors; CMOS image sensors; remote sensing; CCD image sensor; CMOS image sensor; aviation remote sensing; imaging capability; noise affection; noise suppression; CMOS image sensors; CMOS technology; Charge coupled devices; Charge-coupled image sensors; Circuits; Computational Intelligence Society; High-resolution imaging; Noise reduction; Remote sensing; Semiconductor device noise; CMOS Image Sensor(CIS); Fixed Pattern Noise(FPN); Random Noise; Suppression;

fLanguage

English

Publisher

ieee

Conference_Titel

Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on

Conference_Location

Changsha City

Print_ISBN

978-1-4244-5001-5

Electronic_ISBN

978-1-4244-5739-7

Type

conf

DOI

10.1109/ICMTMA.2010.261

Filename

5460209