Title :
All-optical multi-impairment performance monitoring of 640 Gb/s optical signals using a chalcogenide photonic chip
Author :
Vo, T.D. ; Pelusi, M.D. ; Schröder, J. ; Luan, F. ; Madden, S.J. ; Choi, D.-Y. ; Bulla, D. A P ; Luther-Davies, B. ; Eggleton, B.J.
Author_Institution :
ARC Centre for Ultrahigh bandwidth Devices for Opt. Syst. (CUDOS), Univ. of Sydney, Sydney, NSW, Australia
Abstract :
We demonstrate multi-impairment monitoring of 640 Gb/s signals enabled by a broadband photonic-chip-based radio-frequency spectrum analyser. We show simultaneous monitoring of group velocity dispersion, in-band optical signal-to-noise ratio and timing jitter from a single measurement.
Keywords :
integrated optoelectronics; jitter; optical fibre networks; spectral analysers; all-optical multiimpairment performance monitoring; bit rate 640 Gbit/s; chalcogenide photonic chip; group velocity dispersion; inband optical signal-to-noise ratio; optical signals; radiofrequency spectrum analyser; timing jitter; High speed optical techniques; Integrated circuit noise; Monitoring; Nonlinear optics; Optical signal processing; Optical waveguides; RF signals; Radio frequency; Timing jitter; Ultrafast optics;
Conference_Titel :
Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference, 2010 Conference on (OFC/NFOEC)
Conference_Location :
San Diego, CA
Electronic_ISBN :
978-1-55752-884-1
