Title :
High power reliability for plug style optical attenuators
Author :
Shibuya, Takashi ; Nagase, Ryo ; Takahashi, Toru ; Kubo, Daisuke ; Matsuura, Hiroshi
Author_Institution :
NEC Corp., Abiko, Japan
Abstract :
High power damage threshold test and thermal simulation for plug-style optical attenuator were carried out. The degradation mode and its mechanism were clarified. The limit in high power level for assuring long-term reliability was confirmed.
Keywords :
optical attenuators; optical fibre networks; high power damage threshold test; high power reliability; plug style optical attenuators; thermal simulation; Optical attenuators; Optical devices; Optical fiber devices; Optical fiber testing; Optical losses; Plugs; Power measurement; Power system reliability; Stimulated emission; Temperature measurement;
Conference_Titel :
Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference, 2010 Conference on (OFC/NFOEC)
Conference_Location :
San Diego, CA
Electronic_ISBN :
978-1-55752-884-1
