Title :
A 16 Kbits E2PROM Testvehicle for ASIC Technologies
Author :
Dijkstra, E. ; Sen-Gupta, S. ; Li, S. ; Moret, J.M.
Author_Institution :
CSEM, Neuchatel, Switzerland
Abstract :
This paper discusses the basic philosophy, the technology and the most critical circuits for the design of a 16k double poly E2PR0M testvehicle for ASIC technologies. All developments are valid for three generations of technologies (2μm, 1.6μm and 1.2μm).
Keywords :
EPROM; application specific integrated circuits; integrated circuit design; integrated circuit testing; ASIC technologies; double-poly E2PR0M testvehicle design; size 1.2 mum; size 1.6 mum; size 2 mum; Application specific integrated circuits; CMOS technology; Capacitors; Charge transfer; Clocks; Computer architecture; Energy consumption; Sampling methods; Signal restoration; Testing;
Conference_Titel :
Solid-State Circuits Conference, 1990. ESSCIRC '90. Sixteenth European
Conference_Location :
Grenoble
Print_ISBN :
2-86332-087-4
