DocumentCode :
516195
Title :
Block-Oriented Test-Strategy for Analog Circuits
Author :
Schäfer, G. ; Sapotta, H. ; Denner, W.
Author_Institution :
TELEFUNKEN electronic GmbH D-7100 Heilbronn
Volume :
1
fYear :
1991
fDate :
11-13 Sept. 1991
Firstpage :
217
Lastpage :
220
Keywords :
Analog circuits; CMOS logic circuits; CMOS technology; Circuit testing; Digital circuits; Electronic equipment testing; Energy consumption; Frequency; Integrated circuit technology; Logic testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. ESSCIRC '91. Proceedings - Seventeenth European
Conference_Location :
Milan, Italy
Type :
conf
Filename :
5467776
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=516195
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