Title :
A New Trim Technique for Monolithic D/A Converters
Author :
Bowers, Derek F.
Author_Institution :
Precision Monolithics Inc. Santa Clara, California U. S. A.
Abstract :
A new post-assembly bipolar analogue trim technique is described which requires no extra process steps or special test equipment The technique has been applied to produce a monolithic 12 bit D/A converter with better than 0.006% linearity.
Keywords :
Circuit testing; Costs; Fabrication; Laser beam cutting; Linearity; PROM; Packaging; Pins; Resistors; Transistors;
Conference_Titel :
Solid-State Circuits Conference, 1984. ESSCIRC '84. Tenth European
Conference_Location :
Edinburgh, UK
