DocumentCode :
516292
Title :
Deep Sub-Micron BICMOS Circuit Technology for Sub-10 ns ECL 4-Mb DRAMs
Author :
Kawahara, T. ; Kawajiri, Y. ; Kitsukawa, G. ; Sagara, K. ; Kawamoto, Y. ; Akiba, T. ; Kato, S. ; Kawase, Y. ; Itoh, K.
Author_Institution :
Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo 185 Japan
Volume :
1
fYear :
1991
fDate :
11-13 Sept. 1991
Firstpage :
29
Lastpage :
32
Abstract :
Alternatives for on-chip voltage limiters and direct sensing schemes were evaluated in terms of ease of design, voltage margins and speed. Based on these evaluations, a 0.3¿m ECL 4Mb BiCMOS DRAM was designed with a simulated access time of 7.8ns. It incorporates a voltage limiter featuring connection to VCC terminals, a BiCMOS output stage and use of a band-gap reference scheme, and a direct sensing scheme combined with a one-stage MOS amp. Through an analysis of access time dependence on device parameters, severe control of MOS transistor parameters proved to be a great importance in obtaining high speed DRAMs.
Keywords :
BiCMOS integrated circuits; CMOS technology; Design engineering; Laboratories; MOSFETs; Photonic band gap; Pulse amplifiers; Random access memory; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. ESSCIRC '91. Proceedings - Seventeenth European
Conference_Location :
Milan, Italy
Type :
conf
Filename :
5467896
Link To Document :
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