Title :
A New On-Chip Voltage Converter for Submicron High-Density DRAMs
Author :
Furuyama, Tohru ; Watanabe, Yohji ; Ohsawa, Takashi ; Watanabe, Shigeyoshi
Author_Institution :
Semiconductor Device Engineering Lab., Toshiba Corp., 1, Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 210, Japan
Abstract :
A new on-chip voltage converter has been developed, and its characteristics have been examined. Being implemented in an experimental 4Mb dynamic RAM, this voltage converter has successfully demonstrated to be of importance for high-density, high-speed, and high-reliability DRAMs with submicron transistors.
Keywords :
Character generation; Clocks; Equivalent circuits; MOSFETs; Mirrors; Power generation; Semiconductor device reliability; Semiconductor optical amplifiers; Standby generators; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
Conference_Location :
Delft, The Netherlands
