Title :
Present Status and Future Trends in Analog Design Automation
Author_Institution :
CSEM, MALADIERE 71, CH-2000 NEUCHATEL
Keywords :
Bipolar transistors; CMOS analog integrated circuits; Character generation; Design automation; Fluctuations; Information analysis; MOSFETs; Noise shaping; Shape control; System testing;
Conference_Titel :
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location :
Manchester, UK