Title :
ECIPS/DAQ: A Transistor Modelling Environment
Author :
Drazin, Jonathan P.V. ; Barnard, Andrew M.
Author_Institution :
STC Technology Limited, Harlow, England
Abstract :
A general purpose transistor measurement and characterisation system for the development of compact device models is described. The environment comprises a measurement (DAQ) and a parameter extraction (ECIPS) system used in conjunction with a commercial relational database management system (RDBMS).
Keywords :
Circuit simulation; Data acquisition; Environmental management; Instruments; Optimization methods; Parameter extraction; Productivity; Relational databases; Scattering; Writing;
Conference_Titel :
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location :
Manchester, UK
