• DocumentCode
    516562
  • Title

    Design of a Compiler for the Generation of Self-Testable Macros

  • Author

    van Riessen, R.P. ; Kerkhoff, H.G. ; Kloppenburg, A.

  • Author_Institution
    IC-technology and Electronics Group, University of Twente, P.O. box 217, 7500 AE Enschede, The Netherlands
  • fYear
    1988
  • fDate
    21-23 Sept. 1988
  • Firstpage
    194
  • Lastpage
    197
  • Abstract
    This paper describes the design and implementation of a macro-dependent self-test compiler. The compiler requires information from the designer about the type and size of the macro that has to be generated. Dependent on the desired faultcoverage, the compiler automatically generates the layout of the macro, including the appropriate data-generation and evaluation self-test hardware. A scan path, based on the boundary-scan principle, is used to initialize the self-test hardware.
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Integrated circuit testing; Libraries; Performance evaluation; Software tools; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
  • Conference_Location
    Manchester, UK
  • Type

    conf

  • Filename
    5468351