Title :
Trends in Design for Testability
Author_Institution :
IBM CORPORATION, GENERAL TECHNICAL DIVISION, BOULDER, COLORADO, U.S.A.
Abstract :
This paper will present the currently used techniques in the area of Design for Testability. It will begin with the Ad Hoc approaches of In-Circuit techniques, Functional Testing and Signature Analysis. Then the Structured Approaches of Scan Design will be discussed. Finally the techniques of Self-Testing will be discussed such as BILBO, and Exhaustive Testing. With each of these areas, the trends in usage will be indicated.
Keywords :
Automatic testing; Built-in self-test; Cost function; Design for testability; Equations; Logic design; Logic testing; Microprocessors; System testing; Vectors;
Conference_Titel :
Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
Conference_Location :
Delft, The Netherlands
