• DocumentCode
    516587
  • Title

    CEDREC - A Concurrent Error Detection Schema using Residue Codes

  • Author

    Sayers, I.L. ; Russell, G. ; Kinniment, D.J.

  • Author_Institution
    Department of Electrical and Electronic Engineering, University of Newcastle upon Tyne NE1 7RU, England
  • fYear
    1986
  • fDate
    16-18 Sept. 1986
  • Firstpage
    170
  • Lastpage
    172
  • Abstract
    It has been reported that as circuit densities increase the incidence rate of intermittent faults is also increasing. This failure mode, however, is not detected by current test strategies which are directed at detecting permanent faults. The CEDREC schema, which is implemented using mod 3 residue codes, offers a cost effective means of detecting intermittent faults. This schema can be applied readily to a wide range of function types, e.g. arithmetic, logic and storage functions, and hence is ideally suited for integration into VLSI systems. The CEDREC schema also offers a reduction in testing costs when compared with current testing strategies applied to the detection of permanent faults.
  • Keywords
    Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; Integrated circuit testing; Redundancy; System testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
  • Conference_Location
    Delft, The Netherlands
  • Type

    conf

  • Filename
    5468382