DocumentCode :
516587
Title :
CEDREC - A Concurrent Error Detection Schema using Residue Codes
Author :
Sayers, I.L. ; Russell, G. ; Kinniment, D.J.
Author_Institution :
Department of Electrical and Electronic Engineering, University of Newcastle upon Tyne NE1 7RU, England
fYear :
1986
fDate :
16-18 Sept. 1986
Firstpage :
170
Lastpage :
172
Abstract :
It has been reported that as circuit densities increase the incidence rate of intermittent faults is also increasing. This failure mode, however, is not detected by current test strategies which are directed at detecting permanent faults. The CEDREC schema, which is implemented using mod 3 residue codes, offers a cost effective means of detecting intermittent faults. This schema can be applied readily to a wide range of function types, e.g. arithmetic, logic and storage functions, and hence is ideally suited for integration into VLSI systems. The CEDREC schema also offers a reduction in testing costs when compared with current testing strategies applied to the detection of permanent faults.
Keywords :
Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; Integrated circuit testing; Redundancy; System testing; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
Conference_Location :
Delft, The Netherlands
Type :
conf
Filename :
5468382
Link To Document :
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