Title :
An Unified Built in Self-Test Scheme : UBIST
Author_Institution :
TIM3/IMAG - 46 Av. Félix Viallet 38031 Grenoble Cédex - France
Abstract :
Self-checking circuits are used to ensure concurrent error detection for on-line test of integrated circuits. In this paper we introduce an unified built in self-test scheme allowing to ensure all tests needed for integrated circuits : off-line test after manufacturing and on-line concurrent detection.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit manufacture; Integrated circuit testing; Programmable logic arrays; Pulp manufacturing; Signal generators; Test pattern generators;
Conference_Titel :
Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
Conference_Location :
Delft, The Netherlands
