Title :
HIPARE: Circuit and Parameter Extraction from Mask Layout Data
Author :
Roettcher, U. ; Fritz, J. ; Hess, K.G.
Author_Institution :
Fraunhofer Institute for Microelectronic, Circuits and Systems, Bismarckstr. 69, 4100 Duisburg 1, Federal Republic of Germany
Abstract :
We present a program for a technology independent parameter extraction of MOS circuits. It provides all necessary algorithms for a detailed layout analysis including the computation of parasitic resistors and capacitors. Special interest is focused on the implementation of parameter extraction from graphic data allowing arbitrary shapes.
Keywords :
CMOS technology; Circuits and systems; Data mining; Data structures; Integrated circuit interconnections; Integrated circuit noise; Layout; Microelectronics; Parameter extraction; Shape;
Conference_Titel :
Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
Conference_Location :
Delft, The Netherlands
