Title :
A Monolithic 5 1/2 Digit BiMOS A/D Converter
Author :
Rodgers, Bert ; Thurber, Charles
Author_Institution :
GE Semiconductor/Intersil, 10600 Ridgeview Ct., Cupertino, CA 95014, USA
Keywords :
1f noise; CMOS process; Capacitors; Data acquisition; Instruments; Noise measurement; Oscillators; Semiconductor device measurement; Signal to noise ratio; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location :
Manchester, UK
