• DocumentCode
    516639
  • Title

    Statistical Modeling Techniques for thhe Simulation of Mismatch in ICs

  • Author

    Guardiani, C. ; Alini, R. ; Benkoski, J. ; Espinosa, G.

  • Author_Institution
    SGS-Thomson Microelectronics, v.Olivetti 2, 20041 Agrate B.za, ITALY
  • Volume
    1
  • fYear
    1993
  • fDate
    22-24 Sept. 1993
  • Firstpage
    57
  • Lastpage
    60
  • Abstract
    An innovative technique which uses statistical modeling methods to simulate the mismatch of ICs components is presented in this paper. The proposed method is more general than previously published theories, being applicable up to very small device sizes. The present approach has been used to simulate the effect of mismatch on a complex analog circuit. Comparison with measured data confirms the accuracy and efficiency of the method.
  • Keywords
    Analog circuits; Circuit simulation; Distributed computing; Extraterrestrial measurements; Fluctuations; Integrated circuit measurements; Integrated circuit modeling; Microelectronics; Probability distribution; Random variables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1993. ESSCIRC '93. Nineteenth European
  • Conference_Location
    Sevilla, Spain
  • Print_ISBN
    2-86335-134-X
  • Type

    conf

  • Filename
    5468464
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516639