Title :
A Test Concept for a DSP based Codec
Author_Institution :
Siemens Entwicklungszentrum fÿr Mikroelektronik, SiemensstraÃ\x9fe 2, A-9500 Villach, Austria
Abstract :
The increasing performance of chips nowadays demands new test strategies allowing short test time together with a high fault coverage. To decrease the overall test costs board as well as system tests must be supported. Therefore the test concept has to be developed in a very early step of system and circuit design in cooperation with the customer. In this paper a test concept for a DSP based codec including digital and analog BIST will be presented
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Codecs; Digital signal processing; Digital signal processing chips; Programmable logic arrays; Registers; System testing;
Conference_Titel :
Solid-State Circuits Conference, 1994. ESSCIRC '94. Twentieth European
Conference_Location :
Ulm, Germany
Print_ISBN :
2-86332-160-9
