Latched-Flip-Flops - a new scantest-methodology

This paper describes a new scantest-approach which defines a design-independent standardized test-protocol. It guarantees a short time for test-preparation and testerrun. The described latched-flip-flop solves almost all problems in testing multiple clock-designs with an acceptable gate-overhead. By using latched-flip-flops it is possible to implement BIST and INTEST without taking different clocksystems into consideration.