A Precision Measurement System for Modulated Signals

This paper presents a new solution to a precision measurement system for modulated signals based on oversampling techniques. A modular approach, based around a single ASIC device, has been used to ensure that the system can be easily adapted to a number of applications. An analysis of the system is presented together with measurements which verify the functionality of the system. A 20-bit dynamic range has been achieved, where 1 LSB corresponds to 2.5 pA and a signal to noise ratio of 114 dB has been measured. The circuit has been implemented in a 1.2 ¿m CMOS process and required 15.7 mm².