Full RISC Approach for Test Ability

With increasing VLSI complexity, an alternative strategy, that has evolved, is to design in testability at the design stage. This paper deals with the RISC processor design for testability. The instruction set is defined, the processor logic design is performed and the on chip structure for test vectors generation, using the minimum area, is presented. We used the results of the algorithmic information theory to balance the complexity of machine with one of the test sequence, so that the area is minimised.